DocumentCode :
1462363
Title :
Automated 2-D Nanoparticle Manipulation Using Atomic Force Microscopy
Author :
Onal, Cagdas D. ; Ozcan, Onur ; Sitti, Metin
Author_Institution :
Comput. Sci. & Artificial Intell. Lab., Massachusetts Inst. of Technol., Cambridge, MA, USA
Volume :
10
Issue :
3
fYear :
2011
fDate :
5/1/2011 12:00:00 AM
Firstpage :
472
Lastpage :
481
Abstract :
An automated manipulation procedure for spherical nanoparticles with an atomic force microscope (AFM) in 2-D is demonstrated. Robust particle-center and contact-loss detection algorithms are developed using force feedback to improve speed and reliability issues of AFM-based nanomanipulation. Unlike blind manipulation techniques, contact-loss detection enables better control over the success of manipulation. For pattern formation and assembly operations, a fully automated multiple-particle-manipulation method is developed, based on a commanding task planner. The task planner minimizes the obstacles to manipulation trajectories for better efficiency. Forces during AFM tip-particle-substrate contact are analyzed theoretically to determine the mode of manipulation as well as the effect of cantilever normal stiffness. The developed system is used to form patterns and assemblies of 100-nm-diameter gold nanoparticles on a flat substrate.
Keywords :
atomic force microscopy; gold; manipulators; nanofabrication; nanoparticles; AFM tip-particle-substrate contact; AFM-based nanomanipulation; Au; assembly operations; atomic force microscope; atomic force microscopy; automated 2D nanoparticle manipulation; automated manipulation procedure; cantilever normal stiffness; contact-loss detection algorithm; flat substrate; force feedback; fully automated multiple-particle-manipulation method; gold nanoparticles; manipulation trajectories; particle-center detection algorithm; pattern formation; size 100 nm; spherical nanoparticles; task planner; Assembly systems; Atomic force microscopy; Automatic control; Force feedback; Gold; Mechanical engineering; Nanoparticles; Permission; Probes; USA Councils; Atomic force microscopy (AFM); automation; nanoassembly; nanoparticle manipulation; nanorobotics;
fLanguage :
English
Journal_Title :
Nanotechnology, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-125X
Type :
jour
DOI :
10.1109/TNANO.2010.2047510
Filename :
5443466
Link To Document :
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