• DocumentCode
    1462491
  • Title

    Ray-optical determination of the coupling coefficients of grating waveguide by use of the rigorous coupled-wave theory

  • Author

    Park, Suntak ; Song, Seok Ho ; Oh, Cha-Hwan ; Kim, Pill-Soo

  • Author_Institution
    Dept. of Phys., Hanyang Univ., Seoul, South Korea
  • Volume
    19
  • Issue
    1
  • fYear
    2001
  • fDate
    1/1/2001 12:00:00 AM
  • Firstpage
    120
  • Lastpage
    125
  • Abstract
    The ray-optics approach based on the rigorous coupled wave theory, called rigorous ray-optics method (RROM), is developed for the calculation of backward coupling coefficients of grating waveguide devices. The coupling coefficients of several grating structures, such as rectangular, sinusoidal, triangular, and trapezoidal shapes, are evaluated by the RROM, and they are compared with those obtained by two conventional methods of the ray-optics method (ROM) and the coupled-mode method (CMM). In the case of rectangular gratings, the coupling coefficients are evaluated in more detail by varying grating depth and duty-cycle. We have found that the RROM gives us more exact solutions for the backward coupling coefficients of even arbitrary shapes of diffractive grating waveguides than the other two conventional methods
  • Keywords
    diffraction gratings; optical couplers; optical waveguide theory; optical waveguides; ray tracing; backward coupling coefficients; coupled-mode method; coupling coefficients; diffractive grating waveguides; duty-cycle; grating depth; grating waveguide; grating waveguide devices; ray-optical determination; ray-optics approach; rectangular; rectangular gratings; rigorous coupled-wave theory; sinusoidal; trapezoidal shapes; triangular; Coordinate measuring machines; Diffraction gratings; Distributed feedback devices; Geometry; Optical diffraction; Optical waveguides; Read only memory; Shape; Waveguide theory; Wavelength division multiplexing;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/50.914493
  • Filename
    914493