DocumentCode :
14626
Title :
Analysis of parasitic effects in triple-well CMOS SPDT switch
Author :
Pinping Sun ; Peng Liu
Author_Institution :
IBM, Hopewell Junction, NY, USA
Volume :
49
Issue :
11
fYear :
2013
fDate :
May 23 2013
Firstpage :
706
Lastpage :
708
Abstract :
A comparison between a conventional body floating single pole double throw (SPDT) CMOS switch design and a proposed switched gate floating CMOS SPDT switch design based on an analysis of parasitic effects is presented. In standard CMOS technology, the switched gate floating switch is analytically proved to have higher isolation owing to the alleviation of parasitic diode and substrate coupling effects in the operation state. The proposed switch maintains a similar insertion loss as conventional switches while achieving an average of 6 dB isolation improvement over the operating frequency, which agrees well with the presented analysis.
Keywords :
CMOS integrated circuits; switches; body floating switch design; operation state; parasitic diode; parasitic effects; substrate coupling effects; switched gate floating switch design; triple-well CMOS SPDT switch;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el.2013.0945
Filename :
6548182
Link To Document :
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