DocumentCode
14626
Title
Analysis of parasitic effects in triple-well CMOS SPDT switch
Author
Pinping Sun ; Peng Liu
Author_Institution
IBM, Hopewell Junction, NY, USA
Volume
49
Issue
11
fYear
2013
fDate
May 23 2013
Firstpage
706
Lastpage
708
Abstract
A comparison between a conventional body floating single pole double throw (SPDT) CMOS switch design and a proposed switched gate floating CMOS SPDT switch design based on an analysis of parasitic effects is presented. In standard CMOS technology, the switched gate floating switch is analytically proved to have higher isolation owing to the alleviation of parasitic diode and substrate coupling effects in the operation state. The proposed switch maintains a similar insertion loss as conventional switches while achieving an average of 6 dB isolation improvement over the operating frequency, which agrees well with the presented analysis.
Keywords
CMOS integrated circuits; switches; body floating switch design; operation state; parasitic diode; parasitic effects; substrate coupling effects; switched gate floating switch design; triple-well CMOS SPDT switch;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el.2013.0945
Filename
6548182
Link To Document