Title :
Protection of high voltage power and programming pins
Author :
Maloney, Timothy J. ; Parat, Krishna K. ; Clark, Neal K. ; Darwish, Ali
Author_Institution :
Intel Corporation, Santa Clara, CA 95052 USA
Abstract :
Electrostatic discharge (ESD) protection of an integrated circuit´s (IC´s) high voltage power pins is achieved without damage to thin oxides by dividing the steady-state voltage and arranging weak forward bias of the diodes of a cantilever clamp. Also, Vpp programming pins are protected by cantilever clamps of various kinds, including some which turn on when breakdown is detected and turn off after Vcc is powered up.
Keywords :
environmental factors; modelling; recycling; cannibalizing; end-of-life computer disposition; energy requirements; glass; high-grade parts; plastics; primary material source reduction; recycling; separated metals; Aluminum; Building materials; Computer aided manufacturing; Data engineering; Feeds; Inorganic materials; Plastics; Power engineering and energy; Recycling; Steel; Cantilever clamp; EPROM programming; ESD; charged device model; electrostatic discharge; electrostatic discharge protection; human body model; machine model; power supply ESD clamp;
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part C, IEEE Transactions on
DOI :
10.1109/3476.739174
