DocumentCode :
1462866
Title :
Millimeter-wave characteristics of flip-chip interconnects for multichip modules
Author :
Heinrich, Wolfgang ; Jentzsch, Andrea ; Baumann, Guido
Author_Institution :
Ferdinand-Braun-Inst. fur Hochstfrequenztech., Berlin, Germany
Volume :
46
Issue :
12
fYear :
1998
fDate :
12/1/1998 12:00:00 AM
Firstpage :
2264
Lastpage :
2268
Abstract :
Electromagnetic simulation and measurement data of flip-chip transitions are presented. First-order effects are identified and design criteria for millimeter-wave multichip interconnects are derived. Results cover chip detuning and bump geometry as well as simplified modeling. In a coplanar environment, the flip-chip scheme provides interconnects with excellent low-reflective properties. For conductor-backed structures, parasitic modes occur leading to unwanted crosstalk. These effects dominate the behavior so that overall performance of the flip-chip scheme can be evaluated properly only in conjunction with the actual motherboard packaging setup
Keywords :
MIMIC; crosstalk; finite difference methods; flip-chip devices; integrated circuit interconnections; integrated circuit packaging; multichip modules; bump geometry; chip detuning; conductor-backed structures; coplanar environment; crosstalk; electromagnetic simulation; first-order effects; flip-chip interconnects; low-reflective properties; millimeter-wave characteristics; motherboard packaging setup; multichip modules; parasitic modes; Coplanar waveguides; Electromagnetic measurements; Electromagnetic modeling; Finite difference methods; Metallization; Millimeter wave measurements; Millimeter wave technology; Multichip modules; Packaging; Semiconductor device measurement;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.739208
Filename :
739208
Link To Document :
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