• DocumentCode
    1462869
  • Title

    Maximal Linear Embedding for Dimensionality Reduction

  • Author

    Wang, Ruiping ; Shan, Shiguang ; Chen, Xilin ; Chen, Jie ; Gao, Wen

  • Author_Institution
    Dept. of Autom., Tsinghua Univ., Beijing, China
  • Volume
    33
  • Issue
    9
  • fYear
    2011
  • Firstpage
    1776
  • Lastpage
    1792
  • Abstract
    Over the past few decades, dimensionality reduction has been widely exploited in computer vision and pattern analysis. This paper proposes a simple but effective nonlinear dimensionality reduction algorithm, named Maximal Linear Embedding (MLE). MLE learns a parametric mapping to recover a single global low-dimensional coordinate space and yields an isometric embedding for the manifold. Inspired by geometric intuition, we introduce a reasonable definition of locally linear patch, Maximal Linear Patch (MLP), which seeks to maximize the local neighborhood in which linearity holds. The input data are first decomposed into a collection of local linear models, each depicting an MLP. These local models are then aligned into a global coordinate space, which is achieved by applying MDS to some randomly selected landmarks. The proposed alignment method, called Landmarks-based Global Alignment (LGA), can efficiently produce a closed-form solution with no risk of local optima. It just involves some small-scale eigenvalue problems, while most previous aligning techniques employ time-consuming iterative optimization. Compared with traditional methods such as ISOMAP and LLE, our MLE yields an explicit modeling of the intrinsic variation modes of the observation data. Extensive experiments on both synthetic and real data indicate the effectivity and efficiency of the proposed algorithm.
  • Keywords
    computer vision; eigenvalues and eigenfunctions; embedded systems; iterative methods; pattern recognition; LGA; MLE; MLP; computer vision; dimensionality reduction; eigenvalue problems; geometric intuition; iterative optimization; landmarks based global alignment; maximal linear embedding; maximal linear patch; nonlinear dimensionality reduction algorithm; parametric mapping; pattern analysis; Computer vision; Data models; Decision support systems; Maximum likelihood estimation; Dimensionality reduction; landmarks-based global alignment.; manifold learning; maximal linear patch;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2011.39
  • Filename
    5722960