Title :
Current-based testing for deep-submicron VLSIs
Author_Institution :
Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada
Abstract :
Current-based testing for deep-submicron VLSIs is important because of transistor sensitivity to defects as technology scales. However, unabated increases in leakage current in CMOS devices can make this testing very difficult. This article offers several solutions to this challenging problem
Keywords :
CMOS integrated circuits; VLSI; integrated circuit testing; CMOS devices; current-based testing; deep-submicron VLSIs; leakage current; transistor sensitivity; CMOS process; CMOS technology; Capacitance; Differential equations; Electronic equipment testing; Leakage current; MOSFETs; Temperature; Threshold voltage; Very large scale integration;
Journal_Title :
Design & Test of Computers, IEEE
