Title :
Electrooptic mapping of near-field distributions in integrated microwave circuits
Author :
Yang, Kyoung ; David, Gerhard ; Robertson, Stephen V. ; Whitaker, John F. ; Katehi, Linda P B
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
fDate :
12/1/1998 12:00:00 AM
Abstract :
A field mapping system based on external electrooptic sampling has been developed in order to determine the vectorial components of the electric near-field distribution within microwave integrated circuits. The capabilities of the setup are demonstrated by two-dimensional measurements of normal and tangential fields in a coplanar microwave distribution network at frequencies up to 15 GHz. Results obtained on a functioning power-distribution network, as well as on two nonfunctioning networks, show the ability of the technique to interrogate internal circuit operation and to isolate faults through investigation of the field distributions
Keywords :
coplanar waveguide components; electric field measurement; electro-optical devices; integrated circuit testing; microwave integrated circuits; microwave measurement; 15 GHz; MIC testing; coplanar microwave distribution network; electro-optic probe station; electrooptic mapping; external electrooptic sampling; field mapping system; integrated microwave circuits; near-field distributions; power-distribution network; tangential fields; two-dimensional measurements; vectorial components; Antenna measurements; Electric variables measurement; Electromagnetic measurements; Integrated circuit measurements; Microwave integrated circuits; Microwave measurements; Optical sensors; Probes; Sampling methods; Ultrafast optics;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
