DocumentCode :
1463019
Title :
Suppression of the parasitic modes in CPW discontinuities using MCM-D technology-application to a novel 3-dB power splitter
Author :
Soliman, Ezzeldin A. ; Pieters, Philip ; Beyne, Eric ; Vandenbosch, Guy A E
Author_Institution :
IMEC, Leuven, Belgium
Volume :
46
Issue :
12
fYear :
1998
fDate :
12/1/1998 12:00:00 AM
Firstpage :
2426
Lastpage :
2430
Abstract :
In this paper, a new method for the suppression of the parasitic modes in the coplanar waveguide (CPW)-based microwave circuits is presented. The proposed method replaces the costly and mechanically unstable air-bridges, It uses tunnels (bridges) running below (above) the CPW and isolated from it using a thin film layer. This method is convenient for MCM-D technology in which thin films are deposited over the substrate to support the required interconnects. The method is applied to the band reject filter presented in an earlier paper by Rittweger et al. (1991) and compared with the case of air-bridges. The effects of the tunnel parameters on the filter performance are presented and discussed. The new suppression mechanism is also applied on a novel 3-dB power splitter. Experimental and theoretical results of the new power splitter are presented and compared. The agreement between theory and measurements ensures the efficiency of the proposed suppression mechanism
Keywords :
band-stop filters; coplanar waveguide components; microwave filters; microwave integrated circuits; multichip modules; passive filters; power dividers; waveguide discontinuities; CPW discontinuities; CPW-based microwave circuits; MCM-D technology; band reject filter; coplanar waveguide; parasitic modes suppression; power splitter; tunnel parameters; tunnels; Bridge circuits; Coplanar waveguides; Filters; Integrated circuit interconnections; Isolation technology; Microwave circuits; Microwave theory and techniques; Sputtering; Substrates; Thin film circuits;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.739230
Filename :
739230
Link To Document :
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