DocumentCode :
146319
Title :
SoC Scan-Chain verification utilizing FPGA-based emulation platform and SCE-MI interface
Author :
Tomas, Bill Jason ; Yingtao Jiang ; Mei Yang
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Nevada Las Vegas, Las Vegas, NV, USA
fYear :
2014
fDate :
2-5 Sept. 2014
Firstpage :
398
Lastpage :
403
Abstract :
Scan-chain is a well-established design-for-testability (DFT) methodology used for testing digital circuits. As SoC complexity increases, thousands of registers can be used in a design, which makes it difficult to implement full-scan testing. More so, as the complexity of the scan algorithm is dependent on the number of design registers, large SoC scan designs can no longer be verified in RTL simulation unless portioned into smaller sub-blocks. This paper proposes a methodology to decrease scan-chain verification time utilizing SCE-MI (Standard for Co-Emulation Modeling Interface protocol) and an FPGA-based emulation platform. A high-level (SystemC) testbench and FPGA synthesizable hardware transactor models are developed for the ISCAS89 S400 benchmark circuit for high-speed communications between the CPU workstation and the FPGA emulator. The emulation results are compared to other verification methodologies, and found to be 82% faster than regular RTL simulation. In addition, the emulation runs in the MHz speed range, allowing the incorporation of software applications, drivers, and operating systems, as opposed to the Hz range in RTL simulation.
Keywords :
design for testability; field programmable gate arrays; logic testing; system-on-chip; CPU workstation; DFT methodology; FPGA emulator; FPGA synthesizable hardware transactor models; FPGA-based emulation platform; ISCAS89 S400 benchmark circuit; SCE-MI; SoC complexity; SystemC testbench; design registers; design-for-testability methodology; digital circuits testing; high-level testbench; scan-chain verification time; standard for coemulation modeling interface protocol; Acceleration; Clocks; Emulation; Field programmable gate arrays; Hardware; Ports (Computers); Software;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
System-on-Chip Conference (SOCC), 2014 27th IEEE International
Conference_Location :
Las Vegas, NV
Type :
conf
DOI :
10.1109/SOCC.2014.6948962
Filename :
6948962
Link To Document :
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