Characterization of Metrological Grade Analog-to-Digital Converters Using a Programmable Josephson Voltage Standard

Author

Overney, Frédéric ; Rüfenacht, Alain ; Braun, Jean-Pierre ; Jeanneret, Blaise ; Wright, Paul S.

Author_Institution

Fed. Office of Metrol. (METAS), Bern-Wabern, Switzerland

Volume

60

Issue

7

fYear

2011

fDate

7/1/2011 12:00:00 AM

Firstpage

2172

Lastpage

2177

Abstract

A test bench has been developed for systematic characterization of high-resolution analog-to-digital converters. The reference signal is generated by a programable Josephson voltage standard. Three 24-bit digitizers have been characterized. Noise performance has been measured at direct current using the Allan deviation, whereas integral nonlinearity has been measured with quasi-dynamic stepwise triangular waveforms at frequencies between 0.5 Hz and 1 kHz. None of the digitizers outperforms all others for each tested characteristics. Therefore, such a systematic characterization provides the overview needed to identify the most suitable digitizer for a given application.

Keywords

analogue-digital conversion; integrated circuit noise; integrated circuit testing; digitizers; high-resolution analog-digital converters; integral nonlinearity; metrological grade analog-digital converters; noise performance; programmable Josephson voltage standard; quasidynamic stepwise triangular waveforms; reference signal; test bench; Frequency measurement; Hysteresis; Nickel; Noise measurement; Oscillators; White noise; Analog-digital conversion; Josephson junctions; delta–sigma modulation; metrology; noise measurement;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2011.2113950

Filename

5723007