DocumentCode :
146321
Title :
A new approach using symbolic analysis to compute path-dependent effective properties preserving hierarchy
Author :
SRINIVASAN, SUDARSHAN ; Cohen, Emmanuel ; Hofmann, Martin
Author_Institution :
Mentor Graphics Corp, Wilsonville, OR, USA
fYear :
2014
fDate :
2-5 Sept. 2014
Firstpage :
404
Lastpage :
408
Abstract :
This paper describes a technique to calculate an effective property of intentional devices, like resistors, preserving design hierarchy. Traditional methods of computing effective properties like point-to-point resistance, involved using a flat netlist and solving a conductance matrix or flattening a hierarchical netlist and applying reduction techniques to reduce parallel and series resistors. These traditional techniques are not conducive to computing effective resistances on partial paths in hierarchical designs and then using those values to do other rule checks. This is because flattening a netlist of millions of devices to compute a partial path property is very expensive in memory. This paper focuses on an algorithm to efficiently compute effective path-dependent properties on intentional devices in a netlist.
Keywords :
electrostatic discharge; industrial property; system-on-chip; DRC; ERC; clamping resistance; design rule checks; electrical rule checks; electrostatic discharge; hierarchical designs; hierarchical netlist; intellectual property; path-dependent effective properties preserving hierarchy; point-to-point resistance; symbolic analysis; system-on-chip; Algorithm design and analysis; Electrostatic discharges; Logic gates; Performance evaluation; Resistance; Resistors; System-on-chip; Design Rule Checks (DRC); Electrical Overstress (EOS); Electrical Rule Checks (ERC); Electronic Design Automation (EDA); Electrostatic Discharge (ESD); Hard IP (HIP); Intellectual Property(IP); Layout-vs-Schematic (LVS); System-On-Chip (SOC);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
System-on-Chip Conference (SOCC), 2014 27th IEEE International
Conference_Location :
Las Vegas, NV
Type :
conf
DOI :
10.1109/SOCC.2014.6948963
Filename :
6948963
Link To Document :
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