DocumentCode :
1463326
Title :
Performance improvement of the memory hierarchy of RISC-systems by application of 3-D technology
Author :
Kleiner, Michael B. ; Kühn, Stefan A. ; Ramm, Peter ; Weber, Werner
Author_Institution :
Corp. Res. & Dev., Siemens AG, Munich, Germany
Volume :
19
Issue :
4
fYear :
1996
fDate :
11/1/1996 12:00:00 AM
Firstpage :
709
Lastpage :
718
Abstract :
In this paper, the performance of the memory hierarchy of RISC-systems for implementations employing three-dimensional (3-D) technology is investigated. Relating to RISC-systems, 3-D technology enables the integration of multiple chip-layers of memory together with the processor in one 3-D IC. In a first step, the second-level cache can be realized in one 3-D IC with processor and first-level cache. This results in a considerable reduction of the hit time of the second-level cache due to a decreased access time and a larger allowable bus-width to the second-level cache. In a further step, the main memory can be integrated which relieves restrictions with respect to the bus-width to main memory. The use of 3-D technology for system implementation is observed to have a significant impact on the optimum design and performance of the memory hierarchy, Based on an analytical model, performance improvements on the order of 20% to 25% in terms of the average time per instruction are evaluated for implementations employing 3-D technology over conventional ones. It is concluded that 3-D technology is very attractive for future RISC-system generations
Keywords :
cache storage; integrated circuit packaging; integrated memory circuits; microprocessor chips; performance evaluation; reduced instruction set computing; 3D IC; 3D technology; RISC systems; access times; analytical model; main memory integration; memory hierarchy; optimum design; performance improvement; second-level cache; three-dimensional technology; Analytical models; Application software; Integrated circuit modeling; Integrated circuit packaging; Integrated circuit technology; Random access memory; Reduced instruction set computing; Space technology; System performance; Three-dimensional integrated circuits;
fLanguage :
English
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9894
Type :
jour
DOI :
10.1109/96.544361
Filename :
544361
Link To Document :
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