Title :
40-GHz/150-ns versatile pulsed measurement system for microwave transistor isothermal characterization
Author :
Teyssier, Jean-Pierre ; Bouysse, Philippe ; Ouarch, Zineb ; Barataud, Denis ; Peyretaillade, Thierry ; Quéré, Raymond
Author_Institution :
IRCOM, Limoges Univ., France
fDate :
12/1/1998 12:00:00 AM
Abstract :
A versatile pulsed I(V) and 40-GHz RF measurement system is described with all the know-how and methods to perform efficient, safe, and reliable nonlinear transistor measurements. Capability of discrimination between thermal and trapping effects with a pulse setup is demonstrated. Capture and emission constant times of trapping effects are measured. A method to electrically measure the thermal resistance and capacitance of transistors with a pulse setup is proposed
Keywords :
microwave measurement; microwave transistors; pulse measurement; semiconductor device measurement; 40 GHz; capacitance; isothermal nonlinear characteristics; microwave transistor; pulsed RF measurement system; thermal resistance; trap emission constant time; Capacitance measurement; Electric resistance; Electric variables measurement; Electrical resistance measurement; Microwave measurements; Microwave transistors; Performance evaluation; Pulse measurements; Radio frequency; Thermal resistance;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
