The reliability of an experimental transistorized data handling system

Factors which influence reliability of large systems are considered. The construction of the equipment itself is briefly described. The commissioning and maintenance of the equipment and details of the docket-return system used to provide information about the reliability of the components used are discussed. A system of written logic, sup planting conventional drawings, facilitates maintenance. Component failure rates calculated from the fault recording system are given and observations made regarding the reliability achieved and considered possible.