Title :
Boolean equations for multiple paths sensitisation of digital oscillation built-in self test
Author :
Dufaza, C. ; Ihs, H. ; Kaminska, Bozena
Author_Institution :
LIRMM, Montpellier
fDate :
11/12/1998 12:00:00 AM
Abstract :
A major improvement to the digital oscillation built-in self test (DOBIST) method is proposed. The DOBIST technique deals with simultaneously testing path delay, gate delay and stuck-at faults in digital integrated circuits. The equations reported allow concurrent multiple oscillations and greatly improve the DOBIST test quality
Keywords :
Boolean functions; built-in self test; delays; digital integrated circuits; fault diagnosis; integrated circuit testing; logic testing; Boolean equations; DOBIST; concurrent multiple oscillations; digital integrated circuits; digital oscillation built-in self test; gate delay; multiple paths sensitisation; path delay; stuck-at faults; test quality;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19981514
