DocumentCode
1463792
Title
Boolean equations for multiple paths sensitisation of digital oscillation built-in self test
Author
Dufaza, C. ; Ihs, H. ; Kaminska, Bozena
Author_Institution
LIRMM, Montpellier
Volume
34
Issue
23
fYear
1998
fDate
11/12/1998 12:00:00 AM
Firstpage
2213
Lastpage
2215
Abstract
A major improvement to the digital oscillation built-in self test (DOBIST) method is proposed. The DOBIST technique deals with simultaneously testing path delay, gate delay and stuck-at faults in digital integrated circuits. The equations reported allow concurrent multiple oscillations and greatly improve the DOBIST test quality
Keywords
Boolean functions; built-in self test; delays; digital integrated circuits; fault diagnosis; integrated circuit testing; logic testing; Boolean equations; DOBIST; concurrent multiple oscillations; digital integrated circuits; digital oscillation built-in self test; gate delay; multiple paths sensitisation; path delay; stuck-at faults; test quality;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19981514
Filename
739592
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