DocumentCode
1463857
Title
Review on materials, microsensors, systems and devices for high-temperature and harsh-environment applications
Author
Werner, Matthias Ralf ; Fahrner, Wolfgang R.
Author_Institution
Microtechnol. Innovation Team, Deutsche Bank AG, Berlin, Germany
Volume
48
Issue
2
fYear
2001
fDate
4/1/2001 12:00:00 AM
Firstpage
249
Lastpage
257
Abstract
The considerable investment in silicon technology has rarely addressed device use in harsh environments such as high temperatures, aggressive media, and radiation exposure. A clear future requirement is to save weight, volume, and reduce costs in “unfriendly” environments like high temperatures. This can be achieved either by cooling systems or by electronic microsystem components suited to withstand high temperatures. The current status of cooling systems, harsh-environment sensors, and microsystems in view of markets, realized devices, material, properties, process maturity, and packaging technologies are reviewed. Possible semiconductor candidates for high-temperature applications are discussed. The main obstacles for the future of high-temperature and harsh-environment microsystems is highlighted
Keywords
III-V semiconductors; cooling; diamond; gallium compounds; microsensors; semiconductor device metallisation; semiconductor device packaging; semiconductor materials; semiconductor-metal boundaries; silicon compounds; C; GaN; SiC; aggressive media; cooling systems; diodes; electronic microsystem components; harsh-environment; harsh-environment sensors; high-temperature; metal-semiconductor contacts; microsensors; microsystems; packaging technologies; piezoresistive devices; process maturity; radiation exposure; semiconductor device metallisation; semiconductor device packaging; silicon technology; thermal factors; transistors; Consumer electronics; Costs; Electronics cooling; Electronics packaging; Investments; Microsensors; Semiconductor materials; Sensor systems; Silicon; Temperature sensors;
fLanguage
English
Journal_Title
Industrial Electronics, IEEE Transactions on
Publisher
ieee
ISSN
0278-0046
Type
jour
DOI
10.1109/41.915402
Filename
915402
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