• DocumentCode
    1463937
  • Title

    High-responsivity porous-SiC thin-film pn junction photodetector

  • Author

    Wu, K.H. ; Fang, Y.K. ; Hsieh, W.T. ; Ho, J.-J. ; Lin, W.J. ; Hwang, J.D.

  • Author_Institution
    Dept. of Electr. Eng., Nan-Tai Inst. of Technol., Tainan, Taiwan
  • Volume
    34
  • Issue
    23
  • fYear
    1998
  • fDate
    11/12/1998 12:00:00 AM
  • Firstpage
    2243
  • Lastpage
    2244
  • Abstract
    A porous-SiC thin-film photodetector with a pn junction structure has been successfully fabricated on a Si substrate. The developed device exhibits a high responsivity of 0.4 A/W at 25°C for 650 nm irradiation. In particular, the device has a responsivity of 0.35 A/W and a photo/dark current ratio larger than 100 at 200°C, indicating its potential capability for high-temperature operation
  • Keywords
    dark conductivity; optical films; p-n heterojunctions; photoconducting materials; photodetectors; porous materials; silicon compounds; thin film devices; 100 C; 200 C; 25 C; 650 nm; Si; Si substrate; SiC; high responsivity; high-responsivity porous-SiC thin-film pn junction photodetector; high-temperature operation; photo/dark current ratio; pn junction structure; porous-SiC thin-film photodetector;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19981547
  • Filename
    739644