DocumentCode :
1464116
Title :
Frequency-Domain Analysis of Effects of a Diverged Interconnect Design Involved in High-Speed Front-End Electronics
Author :
Lim, Hansang
Author_Institution :
Dept. of Wireless Commun. Eng., Kwangwoon Univ., Seoul, South Korea
Volume :
59
Issue :
10
fYear :
2010
Firstpage :
2779
Lastpage :
2786
Abstract :
Front-end electronics (FEEs) with a trigger function typically involve a diverged interconnect, which transfers signals from an amplifier block to both a magnitude acquisition block and a timing acquisition block. The FEE suffers from inherent reflection due to the impedance mismatch at the diverged interconnect, particularly in high-speed applications. In this paper, the effects of the diverged interconnect in the FEE are analyzed in the frequency domain. A transfer function of the FEE is derived, and the frequency responses are estimated under diverse characteristic impedance and termination conditions of the diverged interconnect. The estimated results are confirmed by performing experiments with test circuits. It can be observed that the frequency range where the frequency response is distorted becomes lower with the increase in the width of the diverged interconnect and its termination capacitance, which corresponded to the input capacitance of the trigger circuit.
Keywords :
capacitance; high-speed integrated circuits; integrated circuit design; integrated circuit interconnections; transfer functions; diverged interconnect design; frequency-domain analysis; high-speed front-end electronics; impedance mismatch; magnitude acquisition block; termination capacitance; timing acquisition block; transfer function; trigger circuit; Capacitance; Circuit testing; Frequency diversity; Frequency domain analysis; Frequency estimation; Impedance; Integrated circuit interconnections; Reflection; Timing; Transfer functions; Characteristic impedance; diverged interconnect; front-end electronics (FEE); termination condition; trigger;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2010.2045257
Filename :
5443723
Link To Document :
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