• DocumentCode
    1464347
  • Title

    Ohmic contacts to semiconducting diamond

  • Author

    Moazed, K.L. ; Nguyen, Richard ; Zeidler, James R.

  • Author_Institution
    North Carolina State Univ., Raleigh, NC, USA
  • Volume
    9
  • Issue
    7
  • fYear
    1988
  • fDate
    7/1/1988 12:00:00 AM
  • Firstpage
    350
  • Lastpage
    351
  • Abstract
    A solid-state reaction process for producing ohmic contacts to polished natural semiconducting diamond surfaces is discussed. The approach attempts to systematically characterize the processes which occur when metallic films of known thickness are deposited on a smooth diamond surface and annealed in the solid state under controlled conditions. Annealed tantalum/gold and titanium/gold deposits on
  • Keywords
    annealing; diamond; elemental semiconductors; gold; ohmic contacts; semiconductor-metal boundaries; tantalum; titanium; Ta-Au-C; Ti-Au-C; annealing; metallic films; metallography; ohmic contacts; scanning electron microscopy; secondary ion mass spectrometry; semiconducting diamond; solid-state reaction process; Annealing; Control systems; Gold; Ohmic contacts; Semiconductivity; Semiconductor films; Solid state circuits; Surface resistance; Thickness control; Titanium;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.740
  • Filename
    740