Title :
Algorithm to predict dry-band arcing in fiber-optic cables
Author :
Karady, George G. ; Devarajan, Srinivasan
Author_Institution :
Arizona State Univ., Tempe, AZ, USA
fDate :
4/1/2001 12:00:00 AM
Abstract :
Utilities frequently use ADSS (all dielectric self-supporting) fiber-optic cables installed on transmission lines 3-6 m below the high voltage conductors. Dry-band arcing occurs on the fiber-optic cables when the cables are polluted and wet. This has been assumed to cause cable failures. An equivalent circuit has been developed to represent the polluted fiber-optic cable in the high voltage environment. The objective of this paper is to present a novel numerical method that can be used to predict dry-band arcing in fiber-optic cables. KCL (Kirchoff´s current law) is used to derive node point equations for the equivalent circuit. Forward elimination and backward substitution of node voltage is used to solve the equations. The effect of pollution, tower arrangement, and conductor sag is analyzed. The numerical method has speed advantages over circuit simulation methods. This method includes conductor sag, nonuniform pollution, and variable capacitance. This algorithm can be used to predict dry band arcing in fiber-optic cables
Keywords :
arcs (electric); equivalent circuits; optical cables; overhead line conductors; poles and towers; power overhead lines; Kirchoff´s current law; all dielectric self-supporting fiber-optic cables; backward node voltage substitution; cable failures; circuit simulation methods; conductor sag; dry-band arcing prediction; equivalent circuit; fiber-optic cables; forward elimination; high voltage environment; node point equations; nonuniform pollution; polluted cables; polluted fiber-optic cable; pollution effect; tower arrangement; transmission lines; variable capacitance; wet cables; Conductors; Dielectrics; Distributed parameter circuits; Equations; Equivalent circuits; Kirchhoff´s Law; Optical fiber cables; Pollution; Prediction algorithms; Voltage;
Journal_Title :
Power Delivery, IEEE Transactions on
