• DocumentCode
    1464563
  • Title

    Theoretical study of device sensitivity and gain saturation of separate absorption, grading, charge, and multiplication InP/InGaAs avalanche photodiodes

  • Author

    Parks, Joseph W. ; Smith, Arlynn W. ; Brennan, Kevin F. ; Tarof, Larry E.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    43
  • Issue
    12
  • fYear
    1996
  • fDate
    12/1/1996 12:00:00 AM
  • Firstpage
    2113
  • Lastpage
    2121
  • Abstract
    In this paper, we present a theoretical investigation into the performance of a separate absorption, grading, charge, and multiplication InP/InGaAs photodiode (SAGCM) using a two-dimensional drift-diffusion model. The analysis examines the sensitivity of the device performance to variations within the overall geometry of the photodiode. Specifically, we explore modifications to the p+ diffusion at the surface of the device, the thickness of the multiplication region, and the relative doping within the mesa charge sheet. It is found that variations within the design specifications may lead to considerable perturbations in the current-voltage response. In addition to the sensitivity analysis, the extent of gain saturation due to space charge effects within the diode is investigated. The effect of gain saturation is observed to agree with analytical based predictions. To the authors´ knowledge, this is the first demonstration of gain saturation due to space charge effects in a SAGCM APD
  • Keywords
    III-V semiconductors; avalanche photodiodes; gallium arsenide; indium compounds; semiconductor device models; InP-InGaAs; SAGCM APD; avalanche photodiode; current-voltage response; design; device sensitivity; gain saturation; mesa charge sheet doping; multiplication; space charge; two-dimensional drift-diffusion model; Absorption; Doping; Geometry; Indium gallium arsenide; Indium phosphide; Performance analysis; Photodiodes; Semiconductor process modeling; Sensitivity analysis; Space charge;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.544382
  • Filename
    544382