• DocumentCode
    1464570
  • Title

    The effect of ion neutralization processes on interfacial energy of stationary contacts

  • Author

    Dervos, Constantine T. ; Michaelides, Joseph M.

  • Author_Institution
    Department of Electrical and Computer Engineering, National Technical University of Athens, Zografou 157 73, Athens, Greece
  • Volume
    21
  • Issue
    4
  • fYear
    1998
  • Firstpage
    541
  • Lastpage
    548
  • Abstract
    Practical utilization of direct measurements of the electrical energy stored at the interface of mechanically contacted metals has been used as a tool to demonstrate experimentally the effect of ion neutralization processes at the interface. Due to the presence of surface asperities, interfacial cavities filled with the gas from the surrounding space may play an important role in charge transport processes, since they provide additional current paths between the non ideally contacted spots of current carrying metallic interfaces. Measurements of the electrical energy stored at the interface were performed in stationary OFHC and silver based alloy contacts in a high vacuum environment (total pressure below 10−5 mbar). The composition of the surrounding space could be determined in situ by employing quadrupole mass spectrometry. The effect of small quantities of nitrogen, oxygen or SF6 on the overall interfacial electrical energy has been investigated for the case of a contact operated at a constant current mode. The obtained experimental results demonstrate convincingly variations of the interfacial electrical energy depending on the composition of the surrounding space and the important role of the non ohmic transport processes across metallic interfaces operating under high charge injection rates.
  • Keywords
    circuit-breaking arcs; life testing; vacuum contactors; wear; AC-4 life testing; arc energy; computer model; contact erosion; electromagnet; probability distribution; runaway; synchronicity; three-phase vacuum contactor; wear; Coils; Computational modeling; Computer simulation; Contactors; Contacts; Electromagnets; Elementary particle vacuum; Life testing; Probability distribution; Vacuum arcs;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9886
  • Type

    jour

  • DOI
    10.1109/95.740046
  • Filename
    740046