DocumentCode :
1464686
Title :
Experimental Determination of Quantum and Centroid Capacitance in Arsenide–Antimonide Quantum-Well MOSFETs Incorporating Nonparabolicity Effect
Author :
Ali, Ashkar ; Madan, Himanshu ; Misra, Rajiv ; Agrawal, Ashish ; Schiffer, Peter ; Boos, J. Brad ; Bennett, Brian R. ; Datta, Suman
Author_Institution :
Pennsylvania State Univ., University Park, PA, USA
Volume :
58
Issue :
5
fYear :
2011
fDate :
5/1/2011 12:00:00 AM
Firstpage :
1397
Lastpage :
1403
Abstract :
Experimental gate capacitance (Cg) versus gate voltage data for InAs0.8Sb0.2 quantum-well MOSFET (QW-MOSFET) is analyzed using a physics-based analytical model to obtain the quantum capacitance (CQ) and centroid capacitance (Ccent). The nonparabolic electronic band structure of the InAs0.8Sb0.2 QW is incorporated in the model. The effective mass extracted from Shubnikov-de Haas magnetotransport measurements is in excellent agreement with that extracted from capacitance measurements. Our analysis confirms that in the operational range of InAs0.8Sb0.2 QW-MOSFETs, quantization and nonparabolicity in the QW enhance CQ and Ccent. Our quantitative model also provides an accurate estimate of the various contributing factors toward Cg scaling in future arsenide-antimonide MOSFETs.
Keywords :
MOSFET; arsenic compounds; galvanomagnetic effects; indium compounds; semiconductor device models; semiconductor quantum wells; InAs0.8Sb0.2; QW-MOSFET; Shubnikov-de Haas magnetotransport measurements; arsenide-antimonide quantum-well MOSFET; capacitance measurements; centroid capacitance; experimental gate capacitance; gate voltage; nonparabolic electronic band structure; nonparabolicity effect; physics-based analytical model; quantum capacitance; Capacitance measurement; Effective mass; Integrated circuit modeling; Logic gates; Quantum capacitance; Temperature measurement; Effective mass; InAsSb; high-$kappa$ dielectric; interface states; nonparabolicity; quantum capacitance; split capacitance–voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2011.2110652
Filename :
5723732
Link To Document :
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