Title :
Use of induced noise to calibrate injection-locked phase noise measurements
Author :
Rodriguez, Alberto ; Dunleavy, Lawrence P. ; Boudiaf, Ali
Author_Institution :
Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA
fDate :
3/1/2001 12:00:00 AM
Abstract :
A new calibration approach is described for phase noise measurements of free-running voltage controlled oscillators using the injection locking technique. The injection locking technique allows the locking of free running oscillators to a reference over a wide bandwidth during a phase noise measurement. Compared to conventional phase noise measurement techniques, the injection locking technique involves a calibration procedure, which may be tedious and time consuming. The new approach may be used to perform an automated calibration procedure of the system commonly used for these measurements.
Keywords :
calibration; circuit noise; electric noise measurement; injection locked oscillators; phase noise; voltage-controlled oscillators; automated calibration; free-running voltage controlled oscillator; induced noise; injection locking; phase noise measurement; Bandwidth; Calibration; Injection-locked oscillators; Measurement techniques; Noise measurement; Performance evaluation; Phase measurement; Phase noise; Voltage measurement; Voltage-controlled oscillators;
Journal_Title :
Microwave and Wireless Components Letters, IEEE
DOI :
10.1109/7260.915621