DocumentCode :
1464752
Title :
Measuring circuits used in an automatic transistor tester
Author :
Sparkes, J.J.
Volume :
24
Issue :
6
fYear :
1962
fDate :
12/1/1962 12:00:00 AM
Firstpage :
479
Lastpage :
488
Abstract :
A machine which is capable of testing, sorting and measuring all the significant parameters of germanium r.f. alloy transistors at a rate of 1200 transistors per hour is described. Since the machine uses essentially only one test head, each measuring circuit, which is mounted on a printed circuit card, is connected in turn to this test head by means of dry reed relays. The paper describes how 10 d.c. parameters and 7 a.c. measurements and tests are carried out on each transistor and explains some of the circuits in detail. In addition the relative merits of single test station and multi-test station machines are discussed.
Keywords :
characteristics measurement; instrumentation; transistors;
fLanguage :
English
Journal_Title :
Radio Engineers, Journal of the British Institution of
Publisher :
iet
Type :
jour
DOI :
10.1049/jbire.1962.0123
Filename :
5261195
Link To Document :
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