• DocumentCode
    1464779
  • Title

    Enhancement of Measurement Efficiency for Electrical Capacitance Tomography

  • Author

    Fan, Zhaoyan ; Gao, Robert X.

  • Author_Institution
    Dept. of Mech. Eng., Univ. of Connecticut, Storrs, CT, USA
  • Volume
    60
  • Issue
    5
  • fYear
    2011
  • fDate
    5/1/2011 12:00:00 AM
  • Firstpage
    1699
  • Lastpage
    1708
  • Abstract
    This paper presents a new sensing method to improve the efficiency of electrical capacitance tomography. Instead of applying one excitation signal to one electrode at a time, the multiple excitation capacitance polling (MECaP) method progressively applies an increasing number of multiple excitations to multiple electrodes and simultaneously measures the capacitance values, thereby significantly increasing the image scanning speed. The performance of a MECaP-based sensor system is numerically simulated and analyzed using the finite element method. Experimental evaluation of the numerical results demonstrates the effectiveness and efficiency of the new sensing technique and its applicability to a broad range of commercial and industrial applications where permittivity determination through capacitance measurement provides an effective means for noninvasive dynamic processes monitoring in an enclosed environment.
  • Keywords
    capacitance measurement; error analysis; finite element analysis; image sensors; tomography; MECaP-based sensor system; electrical capacitance tomography; electrode; finite element method; image scanning speed; industrial application; measurement efficiency enhancement; multiple excitation capacitance polling method; noninvasive dynamic process monitoring; Capacitance; Capacitance measurement; Current measurement; Electrical capacitance tomography; Electrodes; Equivalent circuits; Capacitance measurement; detection algorithms; electrical capacitance tomography (ECT); electronic circuits; error analysis; image sensors; monitoring;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2011.2113010
  • Filename
    5723746