Title :
On-wafer characterization of millimeter-wave antennas for wireless applications
Author :
Simons, Rainee N. ; Lee, Richard Q.
Author_Institution :
NYMA Group, NASA Lewis Res. Center, Cleveland, OH, USA
fDate :
1/1/1999 12:00:00 AM
Abstract :
This paper demonstrates a deembedding technique and a direct on-substrate measurement technique for fast and inexpensive characterization of miniature antennas for wireless applications at millimeter-wave frequencies. The technique is demonstrated by measurements on a tapered slot antenna (TSA). The measured results at Ka-band frequencies include input impedance, mutual coupling between two TSA´s, and absolute gain of TSA
Keywords :
antenna testing; calibration; microstrip antennas; millimetre wave antennas; millimetre wave measurement; EHF; Ka-band frequencies; TRL calibration; absolute gain; deembedding technique; direct on-substrate measurement technique; input impedance; millimeter-wave antennas; miniature antennas; mutual coupling; on-wafer characterization; printed MM-wave antenna; tapered slot antenna; wireless applications; Antenna feeds; Antenna measurements; Bandwidth; Fixtures; Frequency; Impedance; Mutual coupling; Receiving antennas; Slot antennas; Testing;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
