DocumentCode :
1464848
Title :
ATM switching architectures for wafer-scale integration
Author :
Mir-Fakhraei, Nader
Author_Institution :
Adv. Telecommun. Inst., Stevens Inst. of Technol., Hoboken, NJ, USA
Volume :
4
Issue :
4
fYear :
1996
Firstpage :
464
Lastpage :
471
Abstract :
This paper proposes the use of wafer-scale integration (WSI) technology for ATM switching systems and presents two different switching architectures specifically designed for WSI. WSI is particularly useful for switching networks since the interconnection lengths are minimized when the entire network is laid out on a single semiconductor wafer. We propose a defect-tolerant multipath buffered crossbar (MBC) with an expandable structure which can easily be scaled up or down according to the choice of wafer size. We also design an ATM-based Manhattan-street network (MSN) as an alternative architecture, suitable for wafer-scale implementation. We compare the two architectures from different standpoints such as performance, defect-tolerance, delay, practicality, testability, complexity, yield, and area.
Keywords :
B-ISDN; asynchronous transfer mode; delays; digital integrated circuits; electronic switching systems; integrated circuit reliability; semiconductor switches; switching networks; wafer-scale integration; ATM switching architectures; Manhattan-street network; WSI technology; defect-tolerant multipath buffered crossbar; delay; expandable structure; semiconductor wafer; testability; wafer-scale integration; yield; Asynchronous transfer mode; Delay; Switching systems; Testing; Wafer scale integration;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/92.544411
Filename :
544411
Link To Document :
بازگشت