• DocumentCode
    1465490
  • Title

    The asymptotes of the base current in bipolar devices

  • Author

    Castaner, Luis M. ; Ashburn, Peter ; Vinas, Luis Prat ; Wolstenholme, Graham R

  • Author_Institution
    Dept. of Electron. Eng., Univ. Politechnica de Cataluna, Barcelona, Spain
  • Volume
    35
  • Issue
    11
  • fYear
    1988
  • fDate
    11/1/1988 12:00:00 AM
  • Firstpage
    1902
  • Lastpage
    1908
  • Abstract
    Simple analytical equations are derived for the asymptotes of the base current of a bipolar transistor. Three limiting asymptotes are considered, namely, that for a transparent emitter with a high recombination velocity, that for a transparent emitter with a low recombination velocity, and that for an opaque emitter. The asymptote equations are expressed as functions of a measurable fabrication parameter, the emitter-base junction depth. It is shown that the asymptotes can be represented graphically by logarithmic plots of base current density as a function of the emitter-base junction depth, the three asymptotes giving straight lines with gradients of -1, 0, and +1. The asymptote equations are validated by comparison with exact numerical calculations and with experimental data taken from the literature. In this way, it is shown how the asymptote equations can be used to provide valuable insight into the physical mechanisms that control the base currents of different types of bipolar transistor
  • Keywords
    bipolar transistors; current density; semiconductor device models; base current asymptotes; base current density; bipolar transistor; emitter-base junction depth; model; numerical calculations; opaque emitter; recombination velocity; transparent emitter; Bipolar transistors; Computer science; Current measurement; Differential equations; Fabrication; Geometry; Parasitic capacitance; Photovoltaic cells; Radiative recombination; Semiconductor process modeling;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.7403
  • Filename
    7403