DocumentCode
1465677
Title
Testing time for ASICs
Author
Sutlieff, Colin
Volume
37
Issue
1
fYear
1991
fDate
1/17/1991 12:00:00 AM
Firstpage
27
Lastpage
31
Abstract
Application specific integrated circuits (ASICs) have been one of the electronics success stories of the 1980s. The rise in their complexity means that chips are now so complex that it is no longer feasible for a test engineer to understand the design at the level of detail required to generate a test program. ASIC designers are increasingly assuming responsibility for test program development. Fault simulation is discussed and automatic test-vector generation and on-chip test circuits are reviewed
Keywords
application specific integrated circuits; integrated circuit testing; ASIC; application specific integrated circuits; automatic test-vector generation; fault simulation; on-chip test circuits; test program;
fLanguage
English
Journal_Title
IEE Review
Publisher
iet
ISSN
0953-5683
Type
jour
Filename
91656
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