DocumentCode :
1465709
Title :
Selected Wit & Wisdom
Volume :
47
Issue :
3
fYear :
1998
Firstpage :
402
Lastpage :
405
Keywords :
Calendars; Electronic switching systems; Physics; Probability; Process control; Production; Reliability engineering; Statistics; Tellurium; Testing;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1998.740558
Filename :
740558
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1465709
