Title :
Simple method for estimating neutron-induced soft error rates based on modified BGR model
Author :
Tosaka, Y. ; Kanata, H. ; Satoh, S. ; Itakura, T.
Author_Institution :
Fujitsu Labs. Ltd., Atsugi, Japan
Abstract :
Recently the importance of cosmic ray neutron-induced soft errors has been recognized. We propose a simple model to estimate the neutron-induced soft error rates (SER´s), which is a modified version of the burst generation rate (BGR) model. Our model can be used to easily and quickly estimate neutron-induced soft error rates and provides a useful guideline for device and circuit engineers to estimate neutron-induced soft errors (SE´s),.
Keywords :
cosmic ray interactions; errors; neutron effects; burst generation rate model; cosmic ray neutron irradiation; soft error rate; Atmospheric modeling; Circuit simulation; Cosmic rays; Error analysis; Guidelines; Logic circuits; Neutrons; Nuclear electronics; Sea level; Silicon;
Journal_Title :
Electron Device Letters, IEEE
