• DocumentCode
    1465867
  • Title

    Global iterative solution of dielectric spectroscopy equations

  • Author

    Gelinas, Sylvie ; Tran, V.N. ; Vaillancourt, Remi

  • Author_Institution
    Ottawa Univ., Ont., Canada
  • Volume
    39
  • Issue
    4
  • fYear
    1990
  • fDate
    8/1/1990 12:00:00 AM
  • Firstpage
    615
  • Lastpage
    620
  • Abstract
    A global method is presented for solving the permittivity equations for open- and short-circuited coaxial lines of general length for broadband measurements by iterating the recurrence schemes zn+1=c cot zz and z n+1=c tan zn, respectively, and their inverses. The global iteration theory of Fatou and Julia (see J. L. Howland and R. Vaillancourt, Num. Math., vol.46, 323-337, 1985), coupled with linear extrapolation and interpolation and Steffensen´s acceleration procedure, supplies starting values and guarantees convergence even near double roots. When RZ⩾0 for open, and RZ⩽0 for short circuit terminations Newton´s method, with appropriate starting values, converges to the desired roots. A combination of the three iterative schemes results in an almost global method of solution. Numerical results are quoted
  • Keywords
    coaxial cables; convergence of numerical methods; extrapolation; interpolation; iterative methods; permittivity; permittivity measurement; transmission line theory; Newton´s method; Steffensen´s acceleration procedure; broadband measurements; convergence; dielectric measurements; dielectric spectroscopy; double roots; global iteration theory; interpolation; linear extrapolation; open coaxial line; permittivity equations; permittivity measurement; recurrence schemes; short-circuited coaxial lines; Acceleration; Coaxial components; Coupling circuits; Dielectric measurements; Difference equations; Electrochemical impedance spectroscopy; Extrapolation; Interpolation; Length measurement; Permittivity measurement;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.57243
  • Filename
    57243