Improvement of accuracy in measurements of the surface resistance of superconductors using dielectric resonators

Author

Krupka, J. ; Mazierska, J.

Author_Institution

Inst. Mikroelkroniki i Optoelekroniki Politechniki Warszawskiej, Poland

Volume

8

Issue

4

fYear

1998

Firstpage

164

Lastpage

167

Abstract

Two techniques to minimize the influence of parasitic losses on surface resistance measurements of superconductors employing dielectric resonators have been described. The first method optimizes the sapphire resonator aspect ratio to minimize the parasitic losses for given superconductor sample dimensions and measurement frequency. The second utilizes a reference resonator with a perfect conductor plane to cancel out the influence of parasitic losses by measurements of the resonant frequencies and Q-factors of two resonators. The second technique is recommended when materials having noticeable dielectric losses are used to construct dielectric resonators.

Keywords

Q-factor; dielectric resonators; electric resistance measurement; microwave measurement; superconducting materials; surface conductivity; Al/sub 2/O/sub 3/; Q-factor; aspect ratio; dielectric resonator; parasitic loss; reference resonator; resonant frequency; sapphire resonator; superconductor; surface resistance measurement; Conducting materials; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Electrical resistance measurement; Frequency measurement; Loss measurement; Optimization methods; Superconductivity; Surface resistance;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.740681

Filename

740681