DocumentCode
1466270
Title
The Effect of Bonding Temperature and Curing Time on Peel Strength of Anisotropically Conductive Film Flex-On-Board Samples
Author
Kiilunen, Janne ; Frisk, Laura ; Hoikkanen, Maija
Author_Institution
Dept. of Electron., Tampere Univ. of Technol., Tampere, Finland
Volume
12
Issue
2
fYear
2012
fDate
6/1/2012 12:00:00 AM
Firstpage
455
Lastpage
461
Abstract
Today, flex-on-board (FOB) attachments are commonly used in a variety of applications. By using anisotropically conductive adhesives (ACAs), low-cost flex materials that could not withstand typical soldering temperatures can be utilized. This paper examines the effect of manufacturing process parameters on the peel strength of a FOB assembly with an ACA attachment. The effects of bonding time and temperature on the curing properties of the ACA were also studied. The mechanical strength of the assembly was studied using a 90° peel strength test. The results showed that, by elevating curing temperature, better peel test results were obtained due to the higher degree of cure of the ACA. Additionally, longer curing time increased the peel strength. However, it also caused a considerably higher deviation in the results. Failure analysis using scanning electron microscopy showed that, with a higher degree of curing, the failure location in the peel strength test changed from the flex-adhesive interface toward the adhesive-substrate interface.
Keywords
adhesion; adhesive bonding; failure analysis; manufacturing processes; mechanical strength; scanning electron microscopy; ACA attachment; FOB attachments; anisotropically conductive film flex-on-board sample attacthment; bonding temperature effect; failure analysis; flex-adhesive interface; low-cost flex materials; manufacturing process parameters; mechanical strength; peel strength; scanning electron microscopy; soldering temperatures; Bonding; Curing; Flexible printed circuits; Force; Heating; Materials; Temperature measurement; Anisotropically conductive adhesive (ACA); flex-on-board (FOB); peel strength;
fLanguage
English
Journal_Title
Device and Materials Reliability, IEEE Transactions on
Publisher
ieee
ISSN
1530-4388
Type
jour
DOI
10.1109/TDMR.2012.2190413
Filename
6166490
Link To Document