DocumentCode
1466380
Title
Calculation of the uniform breakdown field strength of SF6 gas
Author
Cliteur, G.J. ; Hayashi, Y. ; Haginomori, E. ; Suzuki, K.
Author_Institution
High Power Lab., Toshiba Corp., Japan
Volume
5
Issue
6
fYear
1998
fDate
12/1/1998 12:00:00 AM
Firstpage
843
Lastpage
849
Abstract
We calculated the uniform dielectric breakdown field strength of SF6 gas over the temperature range of 300 to 3000 K. The local thermal equilibrium (ITE) composition of the dissociated gas is connected to the electron impact collision cross sections of the species SF6, F2, F and S. The critical reduced electric field strength of the composition is determined by a balancing electron generation and loss modeled by chemical reactions evaluated by the electron energy distribution function (EEDF) derived from the Boltzmann transport equation. At room temperature, pure SF6 has a critical reduced electric field strength of 362 Td. With increasing temperature and decreasing density we found a small decrease of this value, whereas at temperatures higher than 1500 K, dissociation starts to decrease the dielectric strength of the composition. Furthermore, we found that generation of electrons by (associative) detachment from F - starts to play an important role at temperatures >2500 K, where the critical field strength still has a value of 118 Td. This value is found to decrease rapidly afterwards with increasing temperature to the value of 38 Td at 3000 K. The calculated results agree very well with independently predicted values and measured data
Keywords
Boltzmann equation; SF6 insulation; electric breakdown; electric strength; electron impact dissociation; 300 to 3000 K; Boltzmann transport equation; SF6; SF6 gas; associative detachment; chemical reaction; critical reduced electric field strength; dissociation; electron energy distribution function; electron impact collision cross section; local thermal equilibrium composition; uniform dielectric breakdown field strength; Dielectric breakdown; Dielectric losses; Electric breakdown; Electrons; Fluid flow; Ionization; Kinetic energy; Plasma temperature; Sulfur hexafluoride; Temperature distribution;
fLanguage
English
Journal_Title
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher
ieee
ISSN
1070-9878
Type
jour
DOI
10.1109/94.740765
Filename
740765
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