• DocumentCode
    1466380
  • Title

    Calculation of the uniform breakdown field strength of SF6 gas

  • Author

    Cliteur, G.J. ; Hayashi, Y. ; Haginomori, E. ; Suzuki, K.

  • Author_Institution
    High Power Lab., Toshiba Corp., Japan
  • Volume
    5
  • Issue
    6
  • fYear
    1998
  • fDate
    12/1/1998 12:00:00 AM
  • Firstpage
    843
  • Lastpage
    849
  • Abstract
    We calculated the uniform dielectric breakdown field strength of SF6 gas over the temperature range of 300 to 3000 K. The local thermal equilibrium (ITE) composition of the dissociated gas is connected to the electron impact collision cross sections of the species SF6, F2, F and S. The critical reduced electric field strength of the composition is determined by a balancing electron generation and loss modeled by chemical reactions evaluated by the electron energy distribution function (EEDF) derived from the Boltzmann transport equation. At room temperature, pure SF6 has a critical reduced electric field strength of 362 Td. With increasing temperature and decreasing density we found a small decrease of this value, whereas at temperatures higher than 1500 K, dissociation starts to decrease the dielectric strength of the composition. Furthermore, we found that generation of electrons by (associative) detachment from F - starts to play an important role at temperatures >2500 K, where the critical field strength still has a value of 118 Td. This value is found to decrease rapidly afterwards with increasing temperature to the value of 38 Td at 3000 K. The calculated results agree very well with independently predicted values and measured data
  • Keywords
    Boltzmann equation; SF6 insulation; electric breakdown; electric strength; electron impact dissociation; 300 to 3000 K; Boltzmann transport equation; SF6; SF6 gas; associative detachment; chemical reaction; critical reduced electric field strength; dissociation; electron energy distribution function; electron impact collision cross section; local thermal equilibrium composition; uniform dielectric breakdown field strength; Dielectric breakdown; Dielectric losses; Electric breakdown; Electrons; Fluid flow; Ionization; Kinetic energy; Plasma temperature; Sulfur hexafluoride; Temperature distribution;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/94.740765
  • Filename
    740765