• DocumentCode
    1466505
  • Title

    Comparison of Plasmonic Arrays of Holes Recorded by Interference Lithography and Focused Ion Beam

  • Author

    Menezes, J.W. ; Barea, L.A.M. ; Chillcce, E.F. ; Frateschi, N. ; Cescato, L.

  • Author_Institution
    Inst. de Fis. Gleb Wataghin, UNICAMP, Campinas, Brazil
  • Volume
    4
  • Issue
    2
  • fYear
    2012
  • fDate
    4/1/2012 12:00:00 AM
  • Firstpage
    544
  • Lastpage
    551
  • Abstract
    In this paper, we compare the geometric characteristics and the optical properties of plasmonic hole arrays recorded in gold (Au) films using two different techniques, namely, focused ion beam (FIB) and interference lithography (IL). The morphology of the samples was analyzed using a scanning electron microscope (SEM), and the plasmonic peaks were measured from the transmission spectrum of the samples. The diameters of the holes recorded by IL present approximately the same statistical deviation as those fabricated by FIB but in a much larger area. Although the transmittance measurements of both types of samples exhibit the characteristic plasmonic peaks, the intrinsic fabrication errors of each technique affect differently the optical spectra.
  • Keywords
    focused ion beam technology; gold; infrared spectra; metallic thin films; photolithography; plasmonics; scanning electron microscopy; ultraviolet spectra; visible spectra; Au; FIB; SEM; focused ion beam; geometric characteristics; gold films; interference lithography; intrinsic fabrication errors; morphology; optical properties; plasmonic hole arrays; scanning electron microscopy; statistical deviation; transmission spectrum; ultraviolet-visible-infrared optical spectra; Fabrication; Gold; Interference; Ion beams; Plasmons; Resists; Substrates; Lithography; focused ion beam; interference; plasmonics;
  • fLanguage
    English
  • Journal_Title
    Photonics Journal, IEEE
  • Publisher
    ieee
  • ISSN
    1943-0655
  • Type

    jour

  • DOI
    10.1109/JPHOT.2012.2190497
  • Filename
    6166841