DocumentCode
1466636
Title
A point-contact transistor test set
Author
Hill, R. S.
Author_Institution
General Electric Company, Advanced Electronics Center at Cornell University, Ithaca, N. Y.
Volume
74
Issue
1
fYear
1955
Firstpage
59
Lastpage
62
Abstract
The objective in developing this point-contact transistor test set was to measure the important performance characteristics of point-contact transistors intended for use in large-signal applications of the pulse and switching circuit type. Its compact easy-to-use construction utilizes instruments readily available in any laboratory.
Keywords
Current measurement; Electrical resistance measurement; Instruments; Integrated circuits; Resistance; Switches; Transistors;
fLanguage
English
Journal_Title
Electrical Engineering
Publisher
ieee
ISSN
0095-9197
Type
jour
DOI
10.1109/EE.1955.6439739
Filename
6439739
Link To Document