• DocumentCode
    1466649
  • Title

    Measurements of materials at ultrahigh frequencies

  • Author

    Schwan, Herman ; Li, Kam

  • Author_Institution
    Moore School of Electrical Engineering and the Department of Physical Medicine and Rehabilitation, University of Pennsylvania, Philadelphia, Pa.
  • Volume
    74
  • Issue
    1
  • fYear
    1955
  • Firstpage
    64
  • Lastpage
    64
  • Abstract
    THE best ways to measure the dielectric properties of materials with high dielectric constant are described throughout the frequency range from 100 to 1,000 mc. The principles of measurement of dielectric properties at ultrahigh frequencies are well established. They are based on measurement of voltage standing wave ratio and location of standing wave pattern, which results from reflection of electromagnetic energy from the dielectric sample.
  • Keywords
    Dielectric constant; Dielectric measurements; Frequency measurement; Materials; Power transmission lines; Transmission line measurements;
  • fLanguage
    English
  • Journal_Title
    Electrical Engineering
  • Publisher
    ieee
  • ISSN
    0095-9197
  • Type

    jour

  • DOI
    10.1109/EE.1955.6439741
  • Filename
    6439741
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1466649