DocumentCode
1466736
Title
Pulse Power Generation in Nano- and Subnanosecond Range by Means of Ionizing Fronts in Semiconductors: The State of the Art and Future Prospects
Author
Grekhov, Igor V.
Author_Institution
Ioffe Phys.-Tech. Inst., Russian Acad. of Sci., St. Petersburg, Russia
Volume
38
Issue
5
fYear
2010
fDate
5/1/2010 12:00:00 AM
Firstpage
1118
Lastpage
1123
Abstract
Ionization front propagation in a high-voltage reversely biased silicon p-n diode is the fastest nonoptical process of electron-hole plasma generation in semiconductors. It is capable of switching a high-voltage semiconductor structure from the blocking to the conducting state within several hundreds of picoseconds. Double-donor electron traps with ionization energies of 0.28 and 0.54 eV are the main source of carriers which initiate formation and propagation of these fronts. Dinistor n+ -p-n-p+ structures with such a switching mechanism are capable of generating electric pulses with several kiloamperes of amplitude and nanosecond and even subnanosecond pulse rise time. High-power pulse generators based on these devices have been developed and found applications in many modern technologies. Our numerical simulations indicate a possibility to excite new types of impact ionization fronts which are capable of switching high-voltage devices within dozens of picoseconds.
Keywords
elemental semiconductors; impact ionisation; numerical analysis; p-i-n diodes; p-n junctions; pulse generators; semiconductor plasma; silicon; Si; carrier source; conducting state; dinistor structures; double-donor electron traps; electric pulse generation; electron-hole plasma generation; high-power pulse generators; high-voltage devices; high-voltage semiconductor structure; impact ionization fronts; ionization energies; ionization front propagation; modern technologies; nonoptical process; numerical simulations; pulse power generation; reversely biased silicon p-n diode; subnanosecond range; switching mechanism; Ionizing fronts; pulse power; pulse semi-conductor devices;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/TPS.2010.2043857
Filename
5445002
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