• DocumentCode
    1466886
  • Title

    Large-signal microwave characteristics of resonant-tunneling high electron mobility transistors

  • Author

    Fukuyama, Hiroyuki ; Maezawa, Koichi ; Yamamoto, Masafumi ; Okazaki, Hiroshi ; Muraguchi, Masahiro

  • Author_Institution
    NTT Wireless Syst. Labs., Yokosuka, Japan
  • Volume
    46
  • Issue
    2
  • fYear
    1999
  • fDate
    2/1/1999 12:00:00 AM
  • Firstpage
    281
  • Lastpage
    287
  • Abstract
    The large-signal microwave characteristics of a resonant-tunneling high electron mobility transistor (RTHEMT) are investigated by experiments and simulations. A large number of harmonics, including extremely high-order harmonics with significant power, are observed in both the experiments and the simulations. The dependence of the output spectrum on input power shows that there is a critical input power for producing the extremely high-order harmonics, which is due to the bistability in the transfer characteristics. The origin of the bistability is explained by using an equivalent circuit model for the RTHEMT. Moreover, the dependence of the output power level of the low-order harmonics on input power was found to vary with the DC input voltage. This change of the dependence can be explained by examining the transfer characteristics. The DC transfer characteristics are the key to understanding the large-signal microwave characteristics peculiar to the RTHEMT
  • Keywords
    equivalent circuits; harmonics; high electron mobility transistors; microwave field effect transistors; resonant tunnelling transistors; semiconductor device models; DC input voltage; DC transfer characteristics; RTHEMT; bistability; critical input power; equivalent circuit model; high-order harmonics; large-signal microwave characteristics; low-order harmonics; output spectrum; resonant-tunneling high electron mobility transistors; transfer characteristics; HEMTs; Laboratories; MODFETs; Microwave devices; Microwave oscillators; Power system harmonics; Radio frequency; Resonance; Resonant tunneling devices; Transconductance;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.740892
  • Filename
    740892