Title :
Physics-based minority charge and transit time modeling for bipolar transistors
Author :
Schröter, Michael ; Lee, Tzung-Yin
Author_Institution :
Conerant Syst. Inc., Newport Beach, CA, USA
fDate :
2/1/1999 12:00:00 AM
Abstract :
It has been well known for many years that the transit time model used in the SPICE Gummel-Poon model (SGPM) is not adequate for reliable design of circuits operating either at high current densities (including quasi-saturation), which is often the case in high-speed integrated circuits, or at low voltages, which is important for low-power applications. In addition, extraction of the SGPM´s transit time model parameters is often very difficult and time consuming. Although various proposals for modeling the transit time were published in the past, most of them are not suited for compact transistor models required in circuit simulation from a numerical, parameter extraction and lateral scaling point of view. In this paper, a set of minority charge and transit time equations is derived which are physics-based and laterally scaleable as well as suitable for incorporation into compact models. Experimental results of the new model are presented in terms of transit time and transit frequency versus bias (IC, VCE), geometry, and temperature, showing excellent agreement for different types of silicon homojunction bipolar transistors
Keywords :
SPICE; bipolar integrated circuits; bipolar transistors; circuit simulation; current density; high-speed integrated circuits; low-power electronics; minority carriers; semiconductor device models; SPICE Gummel-Poon model; bipolar transistors; circuit simulation; compact transistor models; current densities; high-speed integrated circuits; homojunction bipolar transistors; lateral scaling; laterally scaleable equations; low-power applications; parameter extraction; physics-based minority charge modelling; transit time modeling; Circuit simulation; Current density; Equations; High speed integrated circuits; Integrated circuit modeling; Integrated circuit reliability; Low voltage; Parameter extraction; Proposals; SPICE;
Journal_Title :
Electron Devices, IEEE Transactions on