DocumentCode :
1467000
Title :
A study on maximum turn-off current of a high-power GTO
Author :
Shimizu, Yoshiteru ; Kimura, Shin ; Kozaka, Hiroshi ; Matsuura, Nobuyoshi ; Tanaka, Tomoyuki ; Monma, Naohiro
Author_Institution :
Res. Lab., Hitachi Ltd., Ibaraki, Japan
Volume :
46
Issue :
2
fYear :
1999
fDate :
2/1/1999 12:00:00 AM
Firstpage :
413
Lastpage :
419
Abstract :
A 6 kV, 6 kA pnpn-type GTO was fabricated and its maximum turn-off current was investigated. The simulation uses a three-segment device model together with an equivalent circuit model. Results of simulations with segments having different on-state voltages showed current concentration in the lower on-state voltage segment in the fall period. By introducing a homogeneous fabrication process, the on-state voltage distribution band was decreased by a factor of 2. The circuit model simulation results showed the maximum peak current of the improved GTO with smaller on-state voltage band was reduced by a factor of 1.33 compared to that of the conventional GTO. A high-power GTO turn-off limiting model was proposed from the measured 6 kA GTO turn-off locus and the segment SOAs. This turn-off limiting model showed that the GTO would be destroyed when the segment current exceeds the SOA at the time a spike voltage occurs in the fall period. It was demonstrated that the maximum turn-off current estimated by this limiting model coincided well with the experimental results
Keywords :
current density; equivalent circuits; semiconductor device models; thyristors; 6 kA; 6 kV; circuit model simulation; current concentration; equivalent circuit model; fall period; high-power GTO; homogeneous fabrication process; maximum turn-off current; on-state voltage distribution band; on-state voltages; pnpn-type GTO; segment current; spike voltage; three-segment device model; turn-off limiting model; Anodes; Associate members; Breakdown voltage; Cathodes; Circuit simulation; Equivalent circuits; Fabrication; Semiconductor optical amplifiers; Snubbers; Thermal stresses;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.740909
Filename :
740909
Link To Document :
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