• DocumentCode
    1467007
  • Title

    Going Nonlinear

  • Author

    Baylis, Charles ; Marks, Robert J., II ; Martin, Josh ; Miller, Hunter ; Moldovan, Matthew

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Baylor Univ., Waco, TX, USA
  • Volume
    12
  • Issue
    2
  • fYear
    2011
  • fDate
    4/1/2011 12:00:00 AM
  • Firstpage
    55
  • Lastpage
    64
  • Abstract
    Since the advent of the nonlinear vector network analyzer (NVNA), microwave engineers have become familiar with new terminology regarding nonlinear network parameters such as "X-parameters" (registered trademark of Agilent Technologies), "S-functions", and "waveform engineering/the Cardiff model", as well as new types of equipment used to perform nonlinear characterizations. These nonlinear network parameter approaches have been developed by Root and Verspecht, Verbeyst and Vanden Bossche, and Tasker. Equipment is now commercially avail able to measure these parameters. To date, X-parameters and S-functions have been predominately used to describe amplifiers in system level simulations. Wave form engineering with the Cardiff model has focused on transistor-level amplifier design. Understanding these behavioral modeling approaches allows their application as an effective and time-saving tool for nonlinear power amplifier design. This article examines the X-parameters and S-functions in an effort to provide a working knowledge that will also apply to understanding the other aforementioned approaches.
  • Keywords
    microwave power amplifiers; network analysers; nonlinear network analysis; Agilent Technologies; Cardiff model; NVNA; S-functions; X-parameters; amplifiers; behavioral modeling; microwave engineers; nonlinear characterizations; nonlinear network parameters; nonlinear power amplifier design; nonlinear vector network analyzer; system level simulations; transistor-level amplifier design; waveform engineering; Current measurement; Frequency measurement; Harmonic analysis; Impedance measurement; Integrated circuit modeling; Load modeling; Nonlinear systems; Scattering parameters;
  • fLanguage
    English
  • Journal_Title
    Microwave Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1527-3342
  • Type

    jour

  • DOI
    10.1109/MMM.2010.940102
  • Filename
    5725552