DocumentCode :
1467048
Title :
Get on the Same Nonlinear Page
Author :
Heimlich, Michael
Author_Institution :
Macquarie Univ., Sydney, NSW, Australia
Volume :
12
Issue :
2
fYear :
2011
fDate :
4/1/2011 12:00:00 AM
Firstpage :
32
Lastpage :
37
Abstract :
In summary, nonlinear modeling is not a trivial exercise: it is our version of rocket science. Compact models have served us well for many years, but there are several shortcomings that behavioral models can address. The industry is experiencing some very heady times for measurement-based models and the test and measurement systems needed to gener ate them. Great progress has been made, but more experience will be needed with measurement-based models before the caveat emptor-let the buyer beware-is completely understood. For this to be accelerated, measurement-based model use and mis use needs to be communicated in a timely manner in a format and within a forum where the collective effort can be freely, openly, and easily discussed with minimal ambiguity. The OWF is working to address this. Like S-parameters before, there will be an adoption period, but if measurement-based mod els live up to their promise, there are very exciting days ahead indeed.
Keywords :
S-parameters; measurement systems; microwave measurement; OWF; S-parameter; behavioral model; compact model; measurement system; measurement-based model; nonlinear modeling; nonlinear page; rocket science; Frequency measurement; Impedance measurement; Integrated circuit modeling; Mathematical model; Nonlinear systems; Scattering parameters; Semiconductor device measurement;
fLanguage :
English
Journal_Title :
Microwave Magazine, IEEE
Publisher :
ieee
ISSN :
1527-3342
Type :
jour
DOI :
10.1109/MMM.2010.940100
Filename :
5725559
Link To Document :
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