DocumentCode :
1467062
Title :
Improving cephalogram analysis through feature subimage extraction
Author :
Chen, Yen-Ting ; Cheng, Kuo-Shen ; Liu, Jia-Kuang
Author_Institution :
Inst. of Biomed. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Volume :
18
Issue :
1
fYear :
1999
Firstpage :
25
Lastpage :
31
Abstract :
A multilayer perceptron (MLP) with a genetic algorithm (GA) is proposed to extract feature subimages containing orthodontic landmarks. Simulated images and cephalograms were used to investigate its performance in comparison with the cross-correlation method. From the results of simulated image containing shapes with different geometrical conditions, it was shown that the fault tolerance of the MLP for rotation, scaling, brightness variety, and other anomalous deformations is good enough to overcome the clinical application problems. It was also shown that the stability, accuracy, and speed of this proposed algorithm are very promising. Moreover, the performance of the MLP can be significantly improved by collecting more "representative" false patterns. The GA is a good approach to speed up the process of feature subimage extraction based on the fitness evaluated using the MLP.
Keywords :
dentistry; diagnostic radiography; feature extraction; genetic algorithms; medical image processing; multilayer perceptrons; anomalous deformations; brightness variety; cephalogram analysis improvement; dental X-rays; false patterns; feature subimage extraction; geometrical conditions; image processing algorithm; medical diagnostic imaging; orthodontic landmarks; rotation; scaling; simulated images; Character recognition; Cranial; Data mining; Feature extraction; Genetic algorithms; Geometry; Gray-scale; Morphology; Neural networks; Skull; Algorithms; Cephalometry; Humans; Image Processing, Computer-Assisted; Maxillofacial Development; Neural Networks (Computer); Orthodontics; Pattern Recognition, Automated; Radiographic Image Enhancement; Skull;
fLanguage :
English
Journal_Title :
Engineering in Medicine and Biology Magazine, IEEE
Publisher :
ieee
ISSN :
0739-5175
Type :
jour
DOI :
10.1109/51.740961
Filename :
740961
Link To Document :
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