DocumentCode :
146731
Title :
Ask the Mutants: Mutating Faulty Programs for Fault Localization
Author :
Seokhyeon Moon ; Yunho Kim ; Moonzoo Kim ; Shin Yoo
Author_Institution :
CS Dept., KAIST, Daejeon, South Korea
fYear :
2014
fDate :
March 31 2014-April 4 2014
Firstpage :
153
Lastpage :
162
Abstract :
We present MUSE (MUtation-baSEd fault localization technique), a new fault localization technique based on mutation analysis. A key idea of MUSE is to identify a faulty statement by utilizing different characteristics of two groups of mutants-one that mutates a faulty statement and the other that mutates a correct statement. We also propose a new evaluation metric for fault localization techniques based on information theory, called Locality Information Loss (LIL): it can measure the aptitude of a localization technique for automated fault repair systems as well as human debuggers. The empirical evaluation using 14 faulty versions of the five real-world programs shows that MUSE localizes a fault after reviewing 7.4 statements on average, which is about 25 times more precise than the state-of-the-art SBFL technique Op2.
Keywords :
program debugging; program testing; software fault tolerance; LIL; MUSE; SBFL technique Op2; automated fault repair system; information theory; locality information loss; mutation analysis; mutation-based fault localization; Educational institutions; Frequency modulation; Information theory; Loss measurement; Maintenance engineering; Testing; fault localization; mutation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Testing, Verification and Validation (ICST), 2014 IEEE Seventh International Conference on
Conference_Location :
Cleveland, OH
Type :
conf
DOI :
10.1109/ICST.2014.28
Filename :
6823877
Link To Document :
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