Title :
A 500-MHz 16*16 complex multiplier using self-aligned gate GaAs heterostructure FET technology
Author :
Akinwande, Akintunde Ibitayo ; Mactaggart, I.R. ; Betz, B.K. ; Grider, D.E. ; Lange, T.H. ; Nohava, J.C. ; Tetzlaff, David E. ; Arch, David K.
fDate :
10/1/1989 12:00:00 AM
Abstract :
A 16*16-bit complex multiplier using self-aligned gate GaAs heterostructure FET technology has been demonstrated. The multiplier uses a modified Booth´s algorithm and three stages of pipeline with an embedded accumulator to allow the computation of a complex multiply function. A total of 4500 gates and over 20000 devices are required to implement this function and self-test functions. The chip produces a 20-bit output allowing 40 bits to describe a complex number result. Direct coupled NOR-gate FET logic was used throughout. The complex multiplier operated at a clock rate of 520 MHz with a power dissipation of 4 W under self-test. This corresponds to an average ´loaded´ gate delay of 96 ps at 0.89 mW/gate. It also means that the multiplier produces a complex product, generated using four real multiplications and two additions, in less than 8 ns. This result demonstrates the high-speed capability of LSI digital circuits fabricated using MBE-grown GaAs heterostructure FET technology.
Keywords :
III-V semiconductors; automatic testing; digital arithmetic; field effect integrated circuits; gallium arsenide; high electron mobility transistors; integrated logic circuits; large scale integration; multiplying circuits; pipeline processing; 4 W; 500 to 520 MHz; 8 ns; 96 ps; DCFL; GaAs; HEMT; III-V semiconductors; LSI digital circuits; MBE-grown; MODFET; NOR-gate FET logic; SAG type; average loaded gate delay; clock rate; complex multiplier; complex multiply function; direct coupled FET logic; embedded accumulator; heterostructure FET technology; high-speed capability; modified Booth´s algorithm; pipeline stages; power dissipation; self-aligned gate; self-test functions; Built-in self-test; Clocks; Delay; Embedded computing; FETs; Gallium arsenide; Large scale integration; Logic devices; Pipelines; Power dissipation;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1989.572600