DocumentCode :
146742
Title :
Experimental Evaluation of SDL and One-Op Mutation for C
Author :
Delamaro, Marcio E. ; Lin Deng ; Serapilha Durelli, Vinicius Humberto ; Nan Li ; Offutt, Jeff
Author_Institution :
Comput. Syst. Dept., Univ. de Sao Paulo, Sao Carlos, Brazil
fYear :
2014
fDate :
March 31 2014-April 4 2014
Firstpage :
203
Lastpage :
212
Abstract :
Mutation analysis modifies a program by applying syntactic rules, called mutation operators, systematically to create many versions of the program (mutants) that differ in small ways. Testers then design tests to cause the mutants to behave differently from the original program. Mutation testing is widely considered to result in very effective tests, however, it is also quite costly. Cost comes from the many mutants that are created, the number of tests that are needed to kill the mutants, and the difficulty of deciding whether mutants behave equivalently to the original program. One-op mutation theorizes that cost can be reduced by using a single, very powerful, mutation operator that leads to tests that are almost as effective as if all operators are used. Previous research proposed the statement deletion operator (SDL) and found promising results. This paper investigates the use of SDL-mutation in a new context, the language C, and poses additional empirical questions, including whether other operators can be used. We carried out a controlled experiment in which cost and effectiveness of each individual C mutation operator were collected for 39 different subject programs. Experimental data are used to define a cost-effectiveness metric to choose the best single operator for one-op mutation.
Keywords :
C language; program testing; specification languages; C language; C mutation operator; One-Op mutation; SDL-mutation; cost-effectiveness metric; experimental evaluation; mutation analysis; mutation testing; program mutants; statement deletion operator; syntactic rules; Computers; Electronic mail; Java; Measurement; Registers; Syntactics; Testing; Mutation operators; Mutation testing; One-op mutation; SDL-mutation; Software testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Testing, Verification and Validation (ICST), 2014 IEEE Seventh International Conference on
Conference_Location :
Cleveland, OH
Type :
conf
DOI :
10.1109/ICST.2014.33
Filename :
6823882
Link To Document :
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